Single-chip dosimeters to accompany photometric systems flown in space

Author

McNulty, Peter J. ; Scheick, Leif Z. ; Yow, Sushan ; Campbell, Arthur B. ; Savage, Mark W.

Author_Institution

Dept. of Phys. & Astron., Clemson Univ., SC, USA

Volume

48

Issue

6

fYear

2001

fDate

12/1/2001 12:00:00 AM

Firstpage

2039

Lastpage

2042

Abstract

Modern photometer systems need to be accompanied by dosimeters that monitor exposure to total ionizing dose, ultraviolet light, and the flux of particles with linear energy transfer above some threshold value. These detectors should minimize space, weight, power, cost, and telemetry. A new approach is described in which single-chip, two-chip, or three-chips systems incorporated into the photometer´s interface circuits measure the above while including information on the status of charge trapping in oxides and thermal noise at p-n junctions

Keywords

aerospace instrumentation; dosimeters; integrated circuit measurement; integrated circuit noise; p-n junctions; photodetectors; photometers; radiation hardening (electronics); thermal noise; ultraviolet radiation effects; charge trapping; cost; interface circuits; linear energy transfer; oxides; p-n junctions; particle flux; photometer systems; photometric systems; power; single-chip; single-chip dosimeters; space; telemetry; thermal noise; three-chip systems; threshold; total ionizing dose; two-chip systems; ultraviolet light; weight; Charge measurement; Circuits; Costs; Current measurement; Detectors; Energy exchange; Monitoring; Noise measurement; Photometry; Telemetry;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/23.983169

Filename

983169