DocumentCode
1560846
Title
Impact of emitter resistance mismatch on base and collector current matching in bipolar transistors
Author
Danaie, Stéphane ; Perrotin, André ; Ghibaudo, Gérard ; Vildeuil, Jean-Charles ; Morin, Gérard ; Laurens, Michel
Author_Institution
Central R&D, STMicroelectronics, Crolles, France
fYear
2006
Firstpage
157
Lastpage
162
Abstract
Bipolar transistor matching is characterized at medium and high current levels using an HF test structure. We demonstrate the predominant impact of emitter resistance mismatch on base and collector current matching at high current. To this end, we simulate base and collector mismatch thanks to the experimental values of emitter access resistance and its variations. The results of these simulations are successfully compared to the experimental data.
Keywords
bipolar transistors; electric current; electric resistance; HF test structure; base current matching; bipolar transistor matching; collector current matching; emitter access resistance; emitter resistance mismatch; Bipolar transistors; Current density; Current measurement; Electrical resistance measurement; Frequency; Hafnium; Needles; Probes; Reproducibility of results; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronic Test Structures, 2006. ICMTS 2006. IEEE International Conference on
Print_ISBN
1-4244-0167-4
Type
conf
DOI
10.1109/ICMTS.2006.1614295
Filename
1614295
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