• DocumentCode
    1561423
  • Title

    Effect of hydrogen plasma for spherical Si solar cells fabricated by high speed dropping method

  • Author

    Omae, Satoshi ; Minemoto, Takashi ; Nakamura, Toshiyuki ; Yamaguchi, Yukio ; Murozono, Mikio ; Takakura, Hideyuki ; Hamakawa, Yoshihiro

  • Author_Institution
    Fac. of Sci. & Eng., Ritsumeikan Univ., Shiga, Japan
  • fYear
    2005
  • Firstpage
    1119
  • Lastpage
    1122
  • Abstract
    The effects of hydrogen passivation on spherical Si solar cells are investigated. The spherical Si solar cells fabricated from Si spheres produced by a dropping method are multicrystalline Si including dislocations and grain boundaries. In order to inactivate the defects, H-passivation was done by R.F. plasma. The short circuit current density and the open circuit voltage of spherical Si solar cells increased after H-passivation, consequently, the conversion efficiency was enhanced. Current voltage characteristics and external quantum efficiency indicated the bulk passivation effect of recombination centers. Laser beam induced current analysis indicated that the crystal defects such as dislocations and grain boundaries were electrically inactive by H-passivation.
  • Keywords
    OBIC; current density; dislocations; elemental semiconductors; grain boundaries; hydrogen; passivation; plasma materials processing; short-circuit currents; silicon; solar cells; RF plasma; Si:H; conversion efficiency; crystal defects; current voltage characteristics; dislocations; external quantum efficiency; grain boundaries; high speed dropping method; hydrogen passivation; hydrogen plasma; laser beam induced current analysis; open circuit voltage; recombination centers; short circuit current density; solar cells; Current-voltage characteristics; Grain boundaries; Hydrogen; Passivation; Photovoltaic cells; Plasma density; Plasma properties; Radiative recombination; Short circuit currents; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2005. Conference Record of the Thirty-first IEEE
  • ISSN
    0160-8371
  • Print_ISBN
    0-7803-8707-4
  • Type

    conf

  • DOI
    10.1109/PVSC.2005.1488332
  • Filename
    1488332