Perpendicular magnetoresistance in bulk metallic multi-layers prepared by cold deformation

Summary form only given. There is much interest in magnetic multi-layers which exhibit giant magnetoresistance (GMR). Current-In-Plane (CIP) MR requires non-magnetic spacer layers which are thinner than the electron mean free path while Current-Perpendicular-to-Plane (CPP) MR requires that these layers be thinner than the spin diffusion length. In given systems, optimised values of CPP MR have been found to be significantly higher than optimised values of CIP MR. However, the measurement of CPP MR in thin film samples is technically difficult, requiring complicated lithography. CIP and CPP MR has been recently measured in bulk Fe/Ag multilayer samples prepared by a press-rolling technique.