Structural features of ZnOxS1???x nanostructured films

Author

Berestok, T.O. ; Opanasyuk, A.S. ; Opanasyuk, N.M.

Author_Institution

Sumy State Univ., Sumy, Ukraine

fYear

2014

fDate

7-13 Sept. 2014

Firstpage

777

Lastpage

778

Abstract

In this paper, ZnO_xS_1-x nanostructured layers were obtained by chemical bath deposition from solutions of zinc acetate, ammonia and thiourea. Structural features of ZnO_xS_1-x films were studied by scanning electron microscopy and X-ray diffraction. The effect of condensation time on the elemental and phase composition of the thin layers, as well as their structural characteristics, such as lattice constants and growth texture, were found.

Keywords

II-VI semiconductors; X-ray diffraction; condensation; liquid phase deposition; nanofabrication; nanostructured materials; scanning electron microscopy; semiconductor growth; semiconductor thin films; texture; wide band gap semiconductors; zinc compounds; X-ray diffraction; ZnO_xS_1-x; ammonia solutions; chemical bath deposition; condensation time; elemental composition; growth texture; lattice constants; phase composition; scanning electron microscopy; structural properties; thin layers; thiourea solutions; zinc acetate solutions; zinc oxide nanostructured films; Annealing; Nickel;

fLanguage

English

Publisher

ieee

Conference_Titel

Microwave & Telecommunication Technology (CriMiCo), 2014 24th International Crimean Conference

Conference_Location

Sevastopol

Print_ISBN

978-966-335-412-5

Type

conf

DOI

10.1109/CRMICO.2014.6959627

Filename

6959627