Degradation of GMR and TMR recording heads using very short duration ESD transients

Summary form only given. ESD testing results for GMR and TMR recording heads using a direct charged device model (DCDM) tester are reported for the first time. The DCDM tester produces an extremely fast 600 ps-wide current transient as shown in Fig. 1. The DCDM test is intended to replicate the ESD event produced by charged metal contact to the device input. The DCDM transient is produced by first charging the device itself and then grounding the device with a mercury relay. The ESD testing was done in-situ with a quasistatic (QST) tester. Resistance amplitude, asymmetry and transfer curves were recorded after each ESD event.