• DocumentCode
    1568102
  • Title

    Low Dose Rate Testing of the Intersil IS1009RH Hardened Voltage Reference and ISL72991RH Negative Low Dropout Regulator

  • Author

    van Vonno, N.W. ; Gill, J.S.

  • Author_Institution
    Intersil Corp., Melbourne
  • Volume
    0
  • fYear
    2007
  • Firstpage
    101
  • Lastpage
    106
  • Abstract
    We report results of baseline 100 krad(Si) low dose rate testing of the Intersil IS1009RH hardened voltage reference and ISL72991RH negative low dropout regulator. Both parts showed minimal to moderate sensitivity to this environment.
  • Keywords
    dosimetry; radiation effects; semiconductor device testing; voltage regulators; ISL72991RH negative low dropout regulator; Intersil IS1009RH hardened voltage reference; low dose rate testing; radiation sensitivity; Analog integrated circuits; Circuit testing; Dielectrics; Fixtures; Performance evaluation; Qualifications; Regulators; Semiconductor device testing; Telephony; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radiation Effects Data Workshop, 2007 IEEE
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-1464-2
  • Type

    conf

  • DOI
    10.1109/REDW.2007.4342548
  • Filename
    4342548
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1568102