DocumentCode
1568111
Title
ELDRS Study of the LT-1078 for Multiple Applications
Author
Love, David P. ; Faul, Jonathan ; Behrens, David ; Peterson, Chris ; Parkinson, James
Author_Institution
Northrop Grumman Corp., Azusa
Volume
0
fYear
2007
Firstpage
107
Lastpage
112
Abstract
Sample LT1078 Op-Amps in five flight biases, including unpowered backup redundancy, underwent ELDRS hardness assurance testing. Application-unique electrical parameters were PSPICE modeled against dose predictions vs. available shielding.
Keywords
SPICE; analogue integrated circuits; dosimetry; integrated circuit modelling; operational amplifiers; radiation hardening (electronics); shielding; ELDRS study; LT-1078 op-amps; PSPICE; application-unique electrical parameters; dose predictions; enhanced low dose-rate sensitivity; hardness assurance testing; radiation shielding; unpowered backup redundancy; Analog integrated circuits; Bipolar transistor circuits; Circuit testing; Degradation; Integrated circuit testing; Manufacturing; Operational amplifiers; Redundancy; Risk management; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation Effects Data Workshop, 2007 IEEE
Conference_Location
Honolulu, HI
Print_ISBN
978-1-4244-1464-2
Type
conf
DOI
10.1109/REDW.2007.4342549
Filename
4342549
Link To Document