Single Event Upset Characterization of GHz Analog to Digital Converters with Dynamic Inputs Using a Beat Frequency Test Method

Author

Kruckmeyer, Kirby ; Rennie, Robert L. ; Ostenberg, Dawn H. ; Ramachandran, Vishwanath ; Hossain, Tareq

Author_Institution

Nat. Semicond., Santa Clara

Volume

0

fYear

2007

Firstpage

113

Lastpage

117

Abstract

Typically, single event upset (SEU) testing of analog to digital converters (ADC) has been done with static inputs. A test method, using a beat frequency and code error detection software, is presented. This test method allows for SEU characterization of ultra high speed ADC´s, using dynamic inputs that more closely reflect the operating conditions in a space application. The test method is demonstrated on National Semiconductor´s ADC08D1000WG-QV at 1 gigasample per second (GSPS) and an input frequency close to 1 GHz. A discussion of the SEU signatures and error rates are also presented.

Keywords

UHF devices; aerospace components; aerospace testing; analogue-digital conversion; error detection; ion beam effects; very high speed integrated circuits; National Semiconductor´s ADC08D1000WG-QV; SEU signatures; analog to digital converters; beat frequency test method; code error detection software; error rates; single event upset characterization; space application; ultra high speed ADC; Analog-digital conversion; Application software; Clocks; Error analysis; Feeds; Frequency conversion; Semiconductor device testing; Single event upset; Software testing; Telephony;

fLanguage

English

Publisher

ieee

Conference_Titel

Radiation Effects Data Workshop, 2007 IEEE

Conference_Location

Honolulu, HI

Print_ISBN

978-1-4244-1464-2

Type

conf

DOI

10.1109/REDW.2007.4342550

Filename

4342550