Magnetic anisotropy of thin Ni[001] films: comparison between static and dynamic techniques

Author

Gubbiotti, G. ; Carlotti, G. ; Ciria, M. ; O´Handley, R.C.

Author_Institution

Dipt. di Fisica, Unita INFM, Perugia, Italy

fYear

2002

Abstract

Summary form only given. The magnetic anisotropy of epitaxial Cu/Ni(d/sub Ni/)/Cu/Si[001] films, with Ni thicknesses (d/sub Ni/) between 17 /spl Aring/ and 150 /spl Aring/, has been studied by Brillouin light scattering (BLS) from spin waves. The results are compared with those previously obtained by static techniques such as torque magnetometry (TM), vibrating sample magnetometry (VSM) and magneto-optic Kerr effect (MOKE). The field dependence of the Damon-Eshbach (DE) mode is reported for two Ni films with thicknesses of 150 /spl Aring/ and 60 /spl Aring/.

Keywords

Brillouin spectra; ferromagnetic materials; magnetic anisotropy; magnetic epitaxial layers; magnetic hysteresis; metallic epitaxial layers; nickel; spin waves; 17 to 150 A; Brillouin light scattering; Cu-Ni-Cu-Si; Cu/Ni(d/sub Ni/)/Cu/Si[001] films; Damon-Eshbach mode; Ni; Ni[001] epitaxial films; Si; dynamic techniques; film thickness; hysteresis loops; magnetic anisotropy; magnetic field dependence; spin waves; static techniques; Iron; Lattices; Magnetic anisotropy; Magnetic films; Materials science and technology; Optical films; Perpendicular magnetic anisotropy; Shearing; Substrates; Surface reconstruction;

fLanguage

English

Publisher

ieee

Conference_Titel

Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International

Conference_Location

Amsterdam, The Netherlands

Print_ISBN

0-7803-7365-0

Type

conf

DOI

10.1109/INTMAG.2002.1001067

Filename

1001067