• DocumentCode
    1569094
  • Title

    Patterned-electron-beam magnetic tomography technique for observing a magnetic field distribution generated by a magnetized material

  • Author

    Suzuki, H. ; Shimakura, T. ; Nakamura, K.

  • Author_Institution
    Central Res. Lab., Hitachi Ltd., Tokyo, Japan
  • fYear
    2002
  • Abstract
    Summary form only given. We have previously reported a technique for mapping a magnetic field distribution over the air-bearing surface of a recording head, see Suzuki et al. (2000, 1998). This technique uses modified transmission electron microscopy and computer processing to produce a three-dimensional intensity profile of a magnetic head field. We demonstrate an improved magnetic sensitivity of this technique and us it to analyze a magnetic vector distribution generated by a sub-micrometer-square area of a magnetized material.
  • Keywords
    magnetic field measurement; magnetic heads; transmission electron microscopy; 3D intensity profile; air-bearing surface; computer processing; magnetic field distribution; magnetic head field; magnetic sensitivity; magnetic vector distribution; magnetized material; patterned-electron-beam magnetic tomography; recording head; transmission electron microscopy; Magnetic fields; Magnetic flux; Magnetic force microscopy; Magnetic heads; Magnetic materials; Magnetic separation; Magnetization; Magnetostatics; Probes; Tomography;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1001098
  • Filename
    1001098