MFM study of magnetic bit patterns of different dimensions

Summary form only given. The focused ion beam (FIB) technique was utilized to pattern the commercial post-sputtering longitudinal recording media into individual bits of different dimensions. A number of horizontal and vertical lines were milled to separate the bits. The MFM observation was employed to study the magnetic property of each bit and the interaction between "transitions" created by the discontinuity of magnetization at the edges of bits. The single domain structures were formed spontaneously as the bit dimension is reduced to 200 nm or less. We demonstrate the new interplay between the magnetostatic energy and exchange energy for patterned media bits.