Effect of high frequency substrate noise on LC-VCOs

Author

Molina, Marc ; Aragones, Xavier ; Mateo, Diego ; González, José Luis

Author_Institution

Electron. Eng. Dept., Univ. Politec. de Catalunya, Barcelona, Spain

fYear

2010

Firstpage

157

Lastpage

160

Abstract

This paper presents an experimental analysis of the performance degradation of an LC-Voltage Controlled Oscillator (LC-VCO) produced by high frequency noise present in the substrate. The spurs observed are shown to be caused by a frequency pulling mechanism. Based on the theory of injection locked oscillators, a new analytical model to predict the behavior of the LC-VCO under the effect of high frequency substrate noise is presented. The analytical model, which is successfully compared with experimental measurements on a 7 GHz LC-VCO, provides rapid intuition on the relation between spurs and circuit parameters.

Keywords

injection locked oscillators; integrated circuit noise; phase noise; voltage-controlled oscillators; LC-VCO; frequency 7 GHz; frequency pulling mechanism; high frequency substrate noise; injection locked oscillator; voltage controlled oscillator; Analytical models; CMOS technology; Circuit noise; Degradation; Injection-locked oscillators; Low-frequency noise; Phase noise; Radio frequency; Semiconductor device measurement; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (MWSCAS), 2010 53rd IEEE International Midwest Symposium on

Conference_Location

Seattle, WA

ISSN

1548-3746

Print_ISBN

978-1-4244-7771-5

Type

conf

DOI

10.1109/MWSCAS.2010.5548582

Filename

5548582