• DocumentCode
    1570555
  • Title

    Effects of disorder in magnetic tunnel junctions

  • Author

    Yun Li ; Ching-Ray Chang

  • Author_Institution
    Dept. of Phys., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2002
  • Abstract
    Summary form only given. The influences of barrier random disorder on tunnel conductance (TC) and magnetoresistance (TMR) in ferromagnet (FM)/insulator(semiconductor) (I(S))/FM junctions are investigated theoretically taking into account spin-orbit (SO) coupling. The TMR decreases significantly due to the spin-flip (SF) scattering caused by the SO coupling. We have found that the SF scattering is much stronger for antiparallel configuration of magnetization due to the reversal of the spin dependence of the final DOS in the spin-flip processes and the TMR can even be inversed when the SF scattering is beyond some critical point. The numerical calculations are performed within the single-orbital tight-binding model using the recursive Green´s function method based on the extended Landauer-Buttiker formula.
  • Keywords
    Green´s function methods; MIM structures; magnetic multilayers; metal-semiconductor-metal structures; recursion method; spin-orbit interactions; tight-binding calculations; tunnelling magnetoresistance; antiparallel magnetization configuration; barrier random disorder effects; extended Landauer-Buttiker formula; ferromagnet/insulator/ferromagnet junctions; ferromagnet/semiconductor/ferromagnet junctions; magnetic tunnel junctions; numerical calculations; recursive Green´s function method; single-orbital tight-binding model; spin-flip scattering; spin-orbit coupling; tunnel conductance; tunnel magnetoresistance; Couplings; Electrons; Impurities; Insulation; Magnetic tunneling; Physics; Plasma temperature; Scattering; Temperature dependence; Tunneling magnetoresistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
  • Conference_Location
    Amsterdam, The Netherlands
  • Print_ISBN
    0-7803-7365-0
  • Type

    conf

  • DOI
    10.1109/INTMAG.2002.1001180
  • Filename
    1001180