DocumentCode
1572061
Title
C dot arrays by ion beam induced chemical vapor deposition (IBICVD)
Author
Lapicki, A. ; Suzuki, T.
Author_Institution
Toyota Technological Institute
fYear
2002
Firstpage
377
Lastpage
377
Abstract
Summary form only given. The idea to pattem the medium for magnetic recording has timulated numerous propositions for fabrication methods. The previously reported development of the IBICVD [I] towards nanoscale fabrication utilizes a focused ion beam (FIB) system. Although best suitable for the laboratory scale, it has its analog among ion projection schemes aming at commercial applications. The principle of the method relies on the energy and momentum exchange between ions (30 keV Ga") and molecules of a precursor suitable for the metal of interest. Collisionally induced decomposition of the precursor is followed by dynamic deposition of the metal on the substrate surface.
Keywords
Annealing; Chemical technology; Chemical vapor deposition; Fabrication; Ion beams; Magnetic materials; Nanoparticles; Saturation magnetization; US Department of Transportation;
fLanguage
English
Publisher
ieee
Conference_Titel
Magnetics Conference, 2002. INTERMAG Europe 2002. Digest of Technical Papers. 2002 IEEE International
Conference_Location
Amsterdam, The Netherlands
Print_ISBN
0-7803-7365-0
Type
conf
DOI
10.1109/INTMAG.2002.1001262
Filename
1001262
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