Effect of edge structure on switching of patterned elements

Summary form only given. The effect of the edge structure on patterned nano-elements is known to have an effect on the switching mechanisms of such thin film elements. In this paper we present results from experimental studies of elements with different edge structures and compare them with simulations performed on a commercial micromagnetics package. Acicular elements with straight and structured edges were fabricated to determine the role of the edges in the switching mechanism. The permalloy (Ni/sub 80/Fe/sub 20/) elements described here had width 250nm, length 2.0/spl mu/m and thickness 30nm. The ends of the elements were tapered to reduce strong demagnetisation effects and suppress domain wall formation. For elements with structured edges both the edge structure height and period were varied.