• DocumentCode
    1575387
  • Title

    Electrical derivative measurement of quantum cascade lasers (QCLs)

  • Author

    Guo, Dingkai ; Chen, Xing ; Cheng, Liwei ; Graninger, Aurelius ; Choa, Fow-Sen

  • Author_Institution
    Dept. of Comput. Sci. & Electr. Eng., Univ. of Maryland, Baltimore, MD
  • fYear
    2008
  • Firstpage
    806
  • Lastpage
    807
  • Abstract
    Testing QCL devices usually requires cryogenic systems, mid-IR windows, optics and detectors. We report here the demonstration of an electrical derivative method that can quickly measure QCL lasing thresholds without using mid-IR optics or detectors.
  • Keywords
    III-V semiconductors; aluminium compounds; electrical resistivity; gallium arsenide; indium compounds; laser variables measurement; quantum cascade lasers; InGaAs-InAlAs; electrical derivative measurement; lasing threshold measurement; quantum cascade lasers; Electric variables measurement; Electrical resistance measurement; Laser modes; Optical pulses; Optical sensors; Pulse measurements; Quantum cascade lasers; Semiconductor device measurement; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IEEE Lasers and Electro-Optics Society, 2008. LEOS 2008. 21st Annual Meeting of the
  • Conference_Location
    Acapulco
  • Print_ISBN
    978-1-4244-1931-9
  • Electronic_ISBN
    978-1-4244-1932-6
  • Type

    conf

  • DOI
    10.1109/LEOS.2008.4688866
  • Filename
    4688866
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1575387