DocumentCode
1577227
Title
Error correction technique for dynamic impedance measurement
Author
Quaresma, Henrique ; Silva, António Pedro ; Serra, António Cruz
Author_Institution
Dept. of Electr. & Comput. Eng., Tech. Univ. of Lisbon, Lisboa, Portugal
Volume
2
fYear
2003
Firstpage
1009
Abstract
In this paper a numerical model of a general purpose instrument to measure the electrical properties of semiconductor devices is presented. Numerical simulation results are compared with experimental data and it is shown that the model can accurately describe the equipment behavior. As a consequence it can be used to correct systematic errors increasing the accuracy of the instrument results.
Keywords
electric impedance measurement; measurement systems; numerical analysis; dynamic impedance measurement; error correction technique; semiconductor devices; Calibration; Current measurement; Digital signal processing; Error correction; Gain measurement; Impedance measurement; Instruments; Numerical models; Testing; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7705-2
Type
conf
DOI
10.1109/IMTC.2003.1207904
Filename
1207904
Link To Document