DocumentCode
1577372
Title
Simulation of the field characteristics of TEM cell using the TLM method
Author
Zhang Yunhua ; Jiang Jingshan
Author_Institution
Center for Space Sci. & Appl. Res., Acad. Sinica, Beijing
fYear
1997
Firstpage
257
Lastpage
260
Abstract
The field distributions of a TEM cell with finite depth of the inner conductor are simulated by using the TLM method. Numerical results show that, both of the cut-off wavelength and field distributions vary with the size of the inner conductor. It also shows that the TLM method can be conveniently and effectively used to analyze and design the TEM cell for EMC measurement
Keywords
digital simulation; electromagnetic compatibility; electromagnetic fields; simulation; test facilities; transmission line matrix methods; EMC measurement; TEM cell; TLM method; cut-off wavelength; field characteristics simulation; inner conductor depth; transmission line matrix; Electromagnetic compatibility;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location
Beijing
Print_ISBN
0-7803-3608-9
Type
conf
DOI
10.1109/ELMAGC.1997.617136
Filename
617136
Link To Document