DocumentCode
1577541
Title
Effective testing of computerized equipment for EMC immunity to fast electrical transients
Author
Wendsche, Steffen ; Habiger, Ernst
Author_Institution
Dept. of Automatic Control, Tech. Univ. Dresden, Germany
fYear
1997
Firstpage
288
Lastpage
291
Abstract
One of the major problems in testing computerized equipment for immunity to electrical transients is their time-variant susceptibility. Since complete immunity testing of an operational cycle with hundreds of susceptible time windows is prohibitive this paper aims at providing methods for affordable estimation of the mean and maximum malfunction probability in an operational cycle. For the latter reinforcement learning algorithms are used which automatically restrict testing to most susceptible time windows. This allows affordable testing also for safety-related equipment and supports effective redesign
Keywords
computer testing; electromagnetic compatibility; learning (artificial intelligence); probability; transients; EMC immunity; computerized equipment testing; fast electrical transients; immunity testing; maximum malfunction probability; mean malfunction probability; operational cycle; reinforcement learning algorithms; safety-related equipment; susceptible time windows; time-variant susceptibility; Computer testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility Proceedings, 1997 International Symposium on
Conference_Location
Beijing
Print_ISBN
0-7803-3608-9
Type
conf
DOI
10.1109/ELMAGC.1997.617143
Filename
617143
Link To Document