• DocumentCode
    1577541
  • Title

    Effective testing of computerized equipment for EMC immunity to fast electrical transients

  • Author

    Wendsche, Steffen ; Habiger, Ernst

  • Author_Institution
    Dept. of Automatic Control, Tech. Univ. Dresden, Germany
  • fYear
    1997
  • Firstpage
    288
  • Lastpage
    291
  • Abstract
    One of the major problems in testing computerized equipment for immunity to electrical transients is their time-variant susceptibility. Since complete immunity testing of an operational cycle with hundreds of susceptible time windows is prohibitive this paper aims at providing methods for affordable estimation of the mean and maximum malfunction probability in an operational cycle. For the latter reinforcement learning algorithms are used which automatically restrict testing to most susceptible time windows. This allows affordable testing also for safety-related equipment and supports effective redesign
  • Keywords
    computer testing; electromagnetic compatibility; learning (artificial intelligence); probability; transients; EMC immunity; computerized equipment testing; fast electrical transients; immunity testing; maximum malfunction probability; mean malfunction probability; operational cycle; reinforcement learning algorithms; safety-related equipment; susceptible time windows; time-variant susceptibility; Computer testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility Proceedings, 1997 International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    0-7803-3608-9
  • Type

    conf

  • DOI
    10.1109/ELMAGC.1997.617143
  • Filename
    617143