• DocumentCode
    1578355
  • Title

    A Technique for Accelerating Injection of Transient Faults in Complex SoCs

  • Author

    Rohani, Alireza ; Kerkhoff, Hans G.

  • Author_Institution
    Testable Design & Test of Integrated Syst. Group, Univ. of Twente, Enschede, Netherlands
  • fYear
    2011
  • Firstpage
    213
  • Lastpage
    220
  • Abstract
    This paper presents a technique for reducing CPU time to perform simulation-based fault-injection experiments in complex SoCs. This technique is fully compatible with commercial HDL simulators with no requirement to develop dedicated compilers. This approach can be easily applied to complex SoC models, as it is not required to modify the top-level modules of design, moreover, it can inject a wide range of fault models in the design and finally it can achieve a competitive reduction in terms of CPU time compared with other time-accelerated simulation-based approaches. These goals are achieved by using simulator-commands along with partial code modification techniques. The experimental results show that the proposed technique is able to reduce the CPU time by a factor ranging from 27% to 67% compared with typical simulation-based fault-injection approaches and by a factor of 10% compared with time-accelerating simulation-based techniques.
  • Keywords
    fault tolerant computing; hardware description languages; system-on-chip; CPU time; commercial HDL simulators; complex SoC models; injection acceleration; partial code modification techniques; simulation-based fault-injection approaches; simulator-commands; time-accelerated simulation-based approaches; transient faults; Analytical models; Circuit faults; Clocks; Hardware design languages; Integrated circuit modeling; System-on-a-chip; Transient analysis; Failure Analysis; Fault Modelling and Simulation; Transient faults;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design (DSD), 2011 14th Euromicro Conference on
  • Conference_Location
    Oulu
  • Print_ISBN
    978-1-4577-1048-3
  • Type

    conf

  • DOI
    10.1109/DSD.2011.31
  • Filename
    6037412