• DocumentCode
    1579378
  • Title

    Effect of Grating Profile in a Surface Plasmon-Polariton Enhanced-Efficiency Schottky Photodetector

  • Author

    Sellai, A.

  • Author_Institution
    Dept. of Phys., Sultan Qaboos Univ., Muscat
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    We use in this work a numerical method based on rigorous coupled wave analysis to calculate the diffraction efficiency in the case of a grating structure which can be a part of a Schottky based photodetector. The effects of the grating thickness, depth, period and filling factor on the diffraction efficiency are investigated. The thickness in particular is found to play a crucial role in determining the overall (sum of diffraction orders) diffraction efficiency since it is the parameter of importance when it comes to consider the degree of coupling between the surface plasmon-polaritons excited at both the air/metal and metal/semiconductor interfaces. Also the optimization of the grating parameters for a minimum reflectance is done at the particular wavelength (lambda =1.5 mum) considering three orders of diffraction. The effect of the grating profile on the diffraction efficiency is interpreted in terms of additional higher order Fourier harmonics added to a fundamental sinusoidal profile.
  • Keywords
    Schottky barriers; diffraction gratings; photodetectors; polaritons; surface plasmons; Schottky photodetector; air/metal interfaces; coupled wave analysis; diffraction efficiency; grating profile; higher order Fourier harmonics; metal/semiconductor interfaces; surface plasmon-polariton; Absorption; Diffraction gratings; Light scattering; Optical coupling; Optical scattering; Particle scattering; Photodetectors; Resonance light scattering; Schottky barriers; Surface waves; Grating structure; Schottky photodetectors; Surface plasmon-polariton;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Information and Communication Technologies: From Theory to Applications, 2008. ICTTA 2008. 3rd International Conference on
  • Conference_Location
    Damascus
  • Print_ISBN
    978-1-4244-1751-3
  • Electronic_ISBN
    978-1-4244-1752-0
  • Type

    conf

  • DOI
    10.1109/ICTTA.2008.4530149
  • Filename
    4530149