• DocumentCode
    1579741
  • Title

    On-chip Monitoring: A Light-Weight Interconnection Network Approach

  • Author

    Ituero, Pablo ; López-Vallejo, Marisa ; Marcos, Miguel Ángel Sánchez ; Osuna, Carlos Gómez

  • Author_Institution
    Dipt. de Ing. Electron., ETSI Telecomun., Univ. Politec. de Madrid, Madrid, Spain
  • fYear
    2011
  • Firstpage
    619
  • Lastpage
    625
  • Abstract
    Current nanometer technologies are subjected to several adverse effects that seriously impact the yield and performance of integrated circuits. Such is the case of within-die parameters uncertainties, varying workload conditions, aging, temperature, etc. Monitoring, calibration and dynamic adaptation have appeared as promising solutions to these issues and many kinds of monitors have been presented recently. In this scenario, where systems with hundreds of monitors of different types have been proposed, the need for light-weight monitoring networks has become essential. In this work we present a light-weight network architecture based on digitization resource sharing of nodes that require a time-to-digital conversion. Our proposal employs a single wire interface, shared among all the nodes in the network, and quantizes the time domain to perform the access multiplexing and transmit the information. It supposes a 16% improvement in area and power consumption compared to traditional approaches.
  • Keywords
    CMOS digital integrated circuits; analogue-digital conversion; integrated circuit interconnections; time-domain analysis; access multiplexing; aging; calibration; digitization resource sharing; dynamic adaptation; integrated circuits; light-weight interconnection network approach; light-weight monitoring networks; nanometer technologies; on-chip monitoring; power consumption; single-wire interface; temperature; time domain; time-to-digital conversion; varying workload conditions; within-die parameters uncertainties; Monitoring; Pulse width modulation; Radiation detectors; Temperature measurement; Temperature sensors; CMOS; Monitoring; On-Chip; aging; dynamic adaptation; leakage; temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Digital System Design (DSD), 2011 14th Euromicro Conference on
  • Conference_Location
    Oulu
  • Print_ISBN
    978-1-4577-1048-3
  • Type

    conf

  • DOI
    10.1109/DSD.2011.84
  • Filename
    6037468