DocumentCode
1584009
Title
Finite Element Analysis Procedure for Board-level Swept Sine Vibration Tests
Author
Yeh, Chang-Lin ; Lai, Yi-Shao ; Wang, Ching-Chun
Author_Institution
Lab. of Stress-Reliability, Adv. Semicond. Eng., Inc., Kaohsiung
fYear
2006
Firstpage
1
Lastpage
4
Abstract
We derive in this paper equations of motion of board-level electronic packages subjected to swept sine vibration loads following the support excitation scheme. Harmonic analysis is performed based on the argument such that at each loading state over the swept sine process, hysteresis responses of solder joints following the isotropic hardening rule vanish fairly quickly so that plasticity is fully developed. Computed and measured acceleration response spectra of a board-level test vehicle are benchmarked
Keywords
electronics packaging; finite element analysis; harmonic analysis; mechanical testing; solders; vibrations; acceleration response spectra; board-level electronic packages; board-level swept sine vibration tests; finite element analysis procedure; harmonic analysis; hysteresis responses; isotropic hardening rule; solder joints; Accelerometers; Electronics packaging; Equations; Finite element methods; Harmonic analysis; Hysteresis; Life estimation; Soldering; Testing; Vehicles;
fLanguage
English
Publisher
ieee
Conference_Titel
Microsystems, Packaging, Assembly Conference Taiwan, 2006. IMPACT 2006. International
Conference_Location
Taipei
Print_ISBN
1-4244-0735-4
Electronic_ISBN
1-4244-0735-4
Type
conf
DOI
10.1109/IMPACT.2006.312203
Filename
4107460
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