• DocumentCode
    1584009
  • Title

    Finite Element Analysis Procedure for Board-level Swept Sine Vibration Tests

  • Author

    Yeh, Chang-Lin ; Lai, Yi-Shao ; Wang, Ching-Chun

  • Author_Institution
    Lab. of Stress-Reliability, Adv. Semicond. Eng., Inc., Kaohsiung
  • fYear
    2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    We derive in this paper equations of motion of board-level electronic packages subjected to swept sine vibration loads following the support excitation scheme. Harmonic analysis is performed based on the argument such that at each loading state over the swept sine process, hysteresis responses of solder joints following the isotropic hardening rule vanish fairly quickly so that plasticity is fully developed. Computed and measured acceleration response spectra of a board-level test vehicle are benchmarked
  • Keywords
    electronics packaging; finite element analysis; harmonic analysis; mechanical testing; solders; vibrations; acceleration response spectra; board-level electronic packages; board-level swept sine vibration tests; finite element analysis procedure; harmonic analysis; hysteresis responses; isotropic hardening rule; solder joints; Accelerometers; Electronics packaging; Equations; Finite element methods; Harmonic analysis; Hysteresis; Life estimation; Soldering; Testing; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microsystems, Packaging, Assembly Conference Taiwan, 2006. IMPACT 2006. International
  • Conference_Location
    Taipei
  • Print_ISBN
    1-4244-0735-4
  • Electronic_ISBN
    1-4244-0735-4
  • Type

    conf

  • DOI
    10.1109/IMPACT.2006.312203
  • Filename
    4107460