DocumentCode
1585647
Title
Revisiting response compaction in space for full scan circuits with nonexhaustive test sets using concept of sequence characterization
Author
Das, Sunil R. ; Assaf, Mansour H. ; Petriu, Emil M. ; Jone, Wen B.
Author_Institution
University of Ottawa
Volume
1
fYear
2003
Firstpage
693
Lastpage
699
Keywords
Automatic testing; Benchmark testing; Built-in self-test; Circuit testing; Compaction; Costs; Design engineering; Hardware; Manufacturing; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2003. IMTC '03. Proceedings of the 20th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7705-2
Type
conf
DOI
10.1109/IMTC.2003.1208246
Filename
1208246
Link To Document