DocumentCode
1586684
Title
Study on modular design for Microwave High Power Automatic Test System
Author
Min, Guo ; Xiucai, Zhao
Author_Institution
Sci. & Technol. on Electron. Test & Meas. Lab., Qingdao, China
Volume
2
fYear
2011
Firstpage
99
Lastpage
103
Abstract
The current difficulty of the microwave high power test is introduced. Modular design of hardware, software and system are especially studied. A universal platform solution for the automated testing of microwave high-power multi-parameter problems is provided, which has been verified in a real Microwave High Power Automatic Test System (MHPATS). These works are useful explorations on the road to meet the increasing correlative test requirements.
Keywords
automatic testing; microwave devices; MHPATS; hardware modular design; microwave high power automatic test system; microwave high-power multi-parameter problem; software modular design; universal platform solution; Extraterrestrial measurements; Instruments; Microwave FET integrated circuits; Microwave integrated circuits; Microwave measurements; Microwave theory and techniques; Software; automatic test system; microwave high power; modular design;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location
Chengdu
Print_ISBN
978-1-4244-8158-3
Type
conf
DOI
10.1109/ICEMI.2011.6037774
Filename
6037774
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