• DocumentCode
    1590423
  • Title

    Complex relative permittivity measurement of ceramics by Fabry-Perot resonator in millimeter frequency range

  • Author

    Itoh, Yoshiteru ; Higashida, Yutaka

  • Author_Institution
    Japan Fine Ceramics Center, Nagoya, Japan
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    200
  • Lastpage
    205
  • Abstract
    Several techniques for measuring accurately the complex permittivity of ceramics using a Fabry-Perot resonator have been developed in millimeter frequency range. Accurate measurement became possible at 40-60 GHz by the three new techniques: 1. exact centering of the sample; 2. exact determination of the sample normal direction parallel to the resonator axis using a laser beam; 3. reduction of the higher-order spurious modes. The relative permittivity, ε, and dielectric loss tangent, tan δ, were measured for commercially available silica substrates. It was found that the value of ε was 3.80, independent of frequency, which is consistent with the general feature of fine ceramics with high purity. The measurement error of ε was ±0.5%
  • Keywords
    Fabry-Perot resonators; ceramics; millimetre wave measurement; permittivity measurement; 40 to 60 GHz; Fabry-Perot resonator; MM-wave methods; SiO2; ceramics; complex relative permittivity measurement; dielectric loss tangent; higher-order spurious modes reduction; laser beam; millimeter frequency range; silica substrates; Ceramics; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Fabry-Perot; Frequency measurement; Laser beams; Laser modes; Permittivity measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Electron Devices for Microwave and Optoelectronic Applications, 1999. EDMO. 1999 Symposium on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-5298-X
  • Type

    conf

  • DOI
    10.1109/EDMO.1999.821485
  • Filename
    821485