Low frequency spurs of VCO due to noise propagation from digital I/O´s and their effects on performance of Bluetooth SoC

Author

Kousai, Shouhei ; Agawa, Kenichi ; Ishikuro, Hiroki ; Majima, Hideaki ; Kobayashi, Hiroyuki ; Miyashita, Daisuke ; Yoshino, Takahisa ; Hama, Youichi ; Hamada, Mototsugu

Author_Institution

SoC Res. & Dev. Center, Toshiba Corp., Kawasaki, Japan

fYear

2005

Firstpage

589

Lastpage

592

Abstract

This paper describes the effect of digital noise on RF circuits on the single chip Bluetooth SoC. Low frequency components in the digital noise, generated by I/O circuits accessing to an external memory, are found to be converted to the phase noise as the spurs of voltage controlled oscillator (VCO). The spurs bring the performance degradation of wireless communications systems. To manage the gain of the VCO and the coupling coefficient is shown to be a key to mitigate the performance degradations.

Keywords

Bluetooth; integrated circuit measurement; integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; phase noise; radiofrequency integrated circuits; system-on-chip; voltage-controlled oscillators; Bluetooth SoC; RF circuits; VCO gain; VCO low frequency spurs; coupling coefficient; digital I/O noise propagation; digital noise; external memory; low frequency components; performance degradation; phase noise; voltage controlled oscillator; wireless communications systems; Bluetooth; Circuit noise; Degradation; Frequency conversion; Low-frequency noise; Noise generators; Phase noise; Radio frequency; Voltage-controlled oscillators; Wireless communication;

fLanguage

English

Publisher

ieee

Conference_Titel

Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE

ISSN

1529-2517

Print_ISBN

0-7803-8983-2

Type

conf

DOI

10.1109/RFIC.2005.1489882

Filename

1489882