• DocumentCode
    1590759
  • Title

    Rigorous study of near and far fields for spot-size converted semiconductor lasers

  • Author

    Rahman, B.M.A. ; Arasaratnam, P. ; Kemper, M. ; Wongcharoen, T. ; Meyer, M. ; Rajarajan, M. ; Grattan, K.T.V.

  • Author_Institution
    Dept. of Electr. Electron. & Inf. Eng., City Univ., London, UK
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    266
  • Lastpage
    271
  • Abstract
    Recently, monolithically integrated spot-size converters (SSCs) have increasingly been used to improve the butt-coupling efficiency between a single mode fiber and a semiconductor laser, without deteriorating the alignment tolerances. In this work, the simulated results presented show the expansion of the spot-size and consequently the increase in the coupling efficiency for various designs of spot-size converters. The reflection coefficients and a study of the alignment tolerances for such SSCs are also presented, as is the far field generated from the modal field profile of the lasers. A field expansion technique has been developed to estimate the evolution of the optical field near the laser facet
  • Keywords
    integrated optics; laser beams; laser modes; light reflection; optical fibre couplers; semiconductor lasers; alignment tolerances; butt-coupling efficiency; coupling efficiency; far fields; field expansion technique; laser facet; modal field profile; monolithically integrated spot-size converters; near fields; optical field evolution; photonic integrated circuits; reflection coefficients; simulated results; single mode fiber; spot-size converted semiconductor lasers; spot-size expansion; Coupling circuits; Fiber lasers; Laser feedback; Laser modes; Optical feedback; Optical reflection; Optical waveguide theory; Optical waveguides; Semiconductor lasers; Waveguide junctions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Performance Electron Devices for Microwave and Optoelectronic Applications, 1999. EDMO. 1999 Symposium on
  • Conference_Location
    London
  • Print_ISBN
    0-7803-5298-X
  • Type

    conf

  • DOI
    10.1109/EDMO.1999.821496
  • Filename
    821496