Non-intrusive testing methodology for CMOS RF LNAs

Author

Liobe, John ; Xiang, Yunan ; Margala, Martin

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Rochester, NY, USA

fYear

2005

Firstpage

653

Lastpage

656

Abstract

This paper proposes a non-intrusive testing methodology for CMOS RF LNAs using the gain of the LNA as a test response to examine the effects of a particular set of spot defects. The impact of four types of resistive bridging faults is analyzed on a practical LNA example. A performance threshold for each fault location is established. Initial results show not only that the use of an ADC is possible, but also that it is a highly accurate device for testing CMOS LNAs. A discussion about both the strengths and limitations of this approach is also included.

Keywords

CMOS analogue integrated circuits; analogue-digital conversion; electrical faults; integrated circuit testing; mixed analogue-digital integrated circuits; network analysis; radiofrequency amplifiers; radiofrequency integrated circuits; CMOS RF LNA; fault location; mixed-signal lC; nonintrusive testing methodology; performance threshold; resistive bridging faults; Circuit faults; Circuit testing; Degradation; Design for testability; Fault location; Local area networks; Low-noise amplifiers; Radio frequency; Semiconductor device modeling; Switches;

fLanguage

English

Publisher

ieee

Conference_Titel

Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE

ISSN

1529-2517

Print_ISBN

0-7803-8983-2

Type

conf

DOI

10.1109/RFIC.2005.1489898

Filename

1489898