• DocumentCode
    1592603
  • Title

    Investigation on inverse volume effect of syntactic foam under uniform dc field stress

  • Author

    Mashkin, Andrey ; Strauchs, Anja ; Schnettler, Armin ; Podlazly, Jörn ; Ress, Karl-Mika

  • Author_Institution
    Inst. for High Voltage Technol., RWTH Aachen Univ., Aachen, Germany
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper deals with the experimental investigation on a new insulation material called syntactic foam. Syntactic foam consists of hollow glass or plastic microspheres casted into a polymeric matrix material in order to obtain a foam-like structure. The investigations carried out focus on the dependency between breakdown field strength and the volume of the stressed material under dc field stress. Specimens of syntactic foam with embedded sphere electrodes and electrode distances up to 8 mm are investigated in a voltage step test until breakdown. For distances of 1 mm and 3 mm a well-known volume effect of higher breakdown field stress on small electrode distances is observed. For distances above 3 mm an inverse effect can be found. The determined characteristic - called inverse volume effect - is ascribed to the specific material structure of syntactic foam.
  • Keywords
    composite insulating materials; electric breakdown; electrodes; polymer foams; breakdown field strength; insulation material; inverse volume effect; plastic microspheres; polymeric matrix material; syntactic foam; uniform DC field stress; Breakdown voltage; Composite materials; Dielectric materials; Dielectrics and electrical insulation; Electric breakdown; Electrodes; Geometry; Glass; Polymer foams; Stress; breakdown field strength; composite material; hollow microspheres; syntactic foam; volume effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4244-6298-8
  • Type

    conf

  • DOI
    10.1109/ELINSL.2010.5549530
  • Filename
    5549530