• DocumentCode
    1592732
  • Title

    Reliability analysis of interconnects at edge tier in datacenters

  • Author

    Yuxin Cheng ; Fiorani, Matteo ; Wosinska, Lena ; Jiajia Chen

  • Author_Institution
    KTH Royal Institute of Technology, Electrum 229, 16440, Kista, Sweden
  • fYear
    2015
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    The growing popularity of cloud based applications is drastically increasing the traffic volume that datacenters have to handle. This brings the need for scalable, reliable, and energy-efficient interconnection networks inside the datacenters. Optical communication has been considered as a promising technology for datacenter applications due to its high energy- and cost-efficiency at ultra-high capacity. A typical datacenter interconnection network includes several tiers. Figure 1 shows an example with three tiers: edge, aggregation and core. Due to the large number of active devices on top of the rack (ToR) energy consumption at the edge tier is dominating the overall power consumed by all the switches within the datacenter [1–2]. Several passive optical interconnect approaches [2–4] have been proposed showing that replacing active optical devices by passive ones is possible to significantly reduce both the hardware cost and energy consumption, achieve lower maintenance complexity and offer a sufficient level of scalability.
  • Keywords
    datacentre networks; reliability; scalability; top of the rack;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Transparent Optical Networks (ICTON), 2015 17th International Conference on
  • Conference_Location
    Budapest, Hungary
  • Type

    conf

  • DOI
    10.1109/ICTON.2015.7193594
  • Filename
    7193594