• DocumentCode
    159422
  • Title

    Modeling of χ(2) in strained silicon based on crystal symmetry

  • Author

    Manganelli, C.L. ; Pintus, P. ; Casu, M.B. ; Andriolli, N. ; Di Pasquale, F.

  • Author_Institution
    Scuola Superiore Sant´Anna, Pisa, Italy
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    65
  • Lastpage
    66
  • Abstract
    The symmetry of the silicon crystal cell under elementary deformation is theoretically investigated. A model exploiting a linear approximation is derived for predicting the behaviour of second-order dielectric susceptibility, providing excellent agreement with experimental results.
  • Keywords
    deformation; electro-optical effects; optical susceptibility; optical waveguides; silicon; Si; elementary deformation; linear approximation; second-order dielectric susceptibility; silicon crystal cell symmetry; Electrooptic effects; Electrooptical waveguides; Lattices; Silicon; Strain; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-2282-6
  • Type

    conf

  • DOI
    10.1109/Group4.2014.6962022
  • Filename
    6962022