DocumentCode
1596731
Title
Effects of electron beam loading on an operating piezoelectric transformer
Author
VanGordon, James A. ; Kovaleski, Scott D. ; Norgard, Peter ; Gall, Brady B. ; Baek Hyun Kim ; Jae Wan Kwon ; Dale, Gregory E.
Author_Institution
Univ. of Missouri, Columbia, MO, USA
fYear
2013
Firstpage
1
Lastpage
1
Abstract
Piezoelectric transformers (PTs) are currently being used to accelerate charged-particle beams for various applications [1, 2]. Beam interactions at the output of the PT can be treated as a parallel RC electrical load. The impedance of the load can affect the output voltage due to the small, finite amount of charge available in the PT. High output voltages necessary for beam acceleration cannot be achieved if the current output from the PT is too high. A thermionic electron emitter was used to provide a controllable beam current for testing the effects of electrical loading on the PT. The electron beam was operated in vacuum pressures of approximately 10-5 Torr. Variations in the electron beam current were used to vary the resistive portion of the load while beam distance was used to vary capacitance. The effects of such variations were measured via bremsstrahlung interactions at the output electrode of the PT to determine output voltage and optical techniques for finding internal operating parameters such as electric field. This paper focuses on determining an optimal beam current and PT placement such that high output voltages are still achieved.
Keywords
electron beams; piezoelectric devices; thermionic electron emission; beam acceleration; beam distance; beam interactions; bremsstrahlung interactions; capacitance; charged particle beams; controllable electron beam current; electric field; electrical loading; electron beam loading; impedance; optimal beam current; output electrode; output voltage; parallel RC electrical load; piezoelectric transformers; thermionic electron emitter; vacuum pressures; Decision support systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location
San Francisco, CA
ISSN
0730-9244
Type
conf
DOI
10.1109/PLASMA.2013.6635004
Filename
6635004
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