• DocumentCode
    1598407
  • Title

    Electric field analysis in insulating films for complex electrode systems

  • Author

    Jambula, Anusha ; Lakdawala, Vishnu ; Basappa, Prathap

  • Author_Institution
    Electr. & Comput. Eng. Dept., Old Dominion Univ., Norfolk, VA, USA
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The present work contributes for an extensive research of physical electrode systems namely axi-symmetric and non-uniform field systems. In an attempt to optimize the dimensions of the electrode system for subsequent use in electrical measurements, such as electroluminescence, capacitance and conduction current, field values at key points (sharp edges and triple junctions) in an axi-symmetric electrode system are simulated as a function of clearances between low voltage and guard electrodes. The configurations simulated, results, analyses and configurations for an optimal design are presented. The hemispherically capped rod-plane gap has been thoroughly used for studies on breakdown characteristics of gaseous dielectrics. In this study, influence of a dielectric barrier on the electric field and potential distributions in a vertically arranged rod-plane gap was numerically analyzed by using 3D BEM field software. Maximum field intensities and their occurrence in the electrode system were examined for different gap distances, applied potentials, and positions of the barrier between electrodes for estimating the discharge phenomena. The results of the field computation show how the maximum electric field varies in small air gaps with thin insulating barriers. There is a good agreement between the values computed with BEM and other methods reported in literature.
  • Keywords
    electrodes; electroluminescence; insulating thin films; complex electrode systems; dielectric barrier; electric field analysis; gaseous dielectrics; guard electrodes; hemispherically capped rod-plane gap; insulating films; low voltage; sharp edges; triple junctions; vertically arranged rod-plane gap; Analytical models; Capacitance measurement; Current measurement; Dielectric breakdown; Dielectrics and electrical insulation; Electric potential; Electric variables measurement; Electrodes; Electroluminescence; Low voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4244-6298-8
  • Type

    conf

  • DOI
    10.1109/ELINSL.2010.5549747
  • Filename
    5549747