• DocumentCode
    1598623
  • Title

    Electronic transport modeling with HSPICE in random CNT networks

  • Author

    Albert, Edgar ; Abdellah, Alaa ; Scarpa, Giuseppe ; Lugli, Paolo

  • Author_Institution
    Inst. for Nanoelectron., Tech. Univ. Munchen, Munich, Germany
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A Monte Carlo based computational model was developed to analyze the electrical transport properties in networks of randomly arranged single wall carbon nanotubes. The CNTs are modeled as stiff sticks with a lognormal distributed length. The average stick length and diameter size are deduced from a CNT film fabricated with the spray deposition technique. Intertube junctions as well as single tubes are represented by resistances. The analyzed networks are composed of both metallic and semiconducting CNTs in a ratio of 1/3. The electrical properties are obtained with the circuit analysis and simulation tool HSPICE. The measured sheet resistances and conductivities were compared with the simulation results. The validity of the model is confirmed by the good match between the simulation and experimentally obtained results.
  • Keywords
    Monte Carlo methods; carbon nanotubes; electrical conductivity; electrical resistivity; nanofabrication; spraying; thin films; C; CNT film; Monte Carlo based computational model; average stick length; circuit analysis; electrical transport properties; electronic transport modeling; intertube junctions; lognormal distributed length; random CNT networks; sheet conductivities; sheet resistances; simulation tool HSPICE; single wall carbon nanotubes; spray deposition technique; Carbon; Integrated circuit modeling; Manganese; Monte Carlo methods; Substrates; Carbon nanotubes; HSPICE; nanotube network; spray deposition;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
  • Conference_Location
    Birmingham
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4673-2198-3
  • Type

    conf

  • DOI
    10.1109/NANO.2012.6321992
  • Filename
    6321992