• DocumentCode
    1599916
  • Title

    Power semiconductors state-of-art and development trends

  • Author

    Lorenz, Leo

  • Author_Institution
    Infineon Technol., Munich
  • fYear
    2007
  • Firstpage
    683
  • Lastpage
    686
  • Abstract
    System integration and high power density of monolithic and multi-chip designs are the driving force for the progress in power electronic systems. The whole system has to be considered and optimized to meet this target and to keep the overall ruggedness, sensitivity towards EMI and long term reliability, Silicon utilization system reliability and power units miniaturization are the key factors. Power semiconductors are primarily used to control the flow of energy between the energy source and the load, and to do so with great precision, with extremely fast control times and with low dissipated power. The drive towards rational use of energy, miniaturization of electrical systems and power management has given impetus to the revolutionary development of power semiconductors and power electronic systems over the last 20 years. In this paper new technologies, advanced devices concepts and future system aspect for industrial segments are discussed. In these fields of applications there are huge requirements towards system dynamic characteristic, overload capability, ruggedness behaviour and reliability. High operating temperatures is required, in the industrial high blocking voltage capabilities are needed.
  • Keywords
    power semiconductor devices; semiconductor device reliability; power electronic systems; power semiconductors; power units miniaturization; silicon utilization system reliability; Board of Directors; Cathodes; Electromagnetic interference; HVDC transmission; Power electronics; Power system reliability; Protection; Silicon; Thyristors; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics, 2007. ICPE '07. 7th Internatonal Conference on
  • Conference_Location
    Daegu
  • Print_ISBN
    978-1-4244-1871-8
  • Electronic_ISBN
    978-1-4244-1872-5
  • Type

    conf

  • DOI
    10.1109/ICPE.2007.4692474
  • Filename
    4692474