• DocumentCode
    1600236
  • Title

    Research on surface flashover properties of polytetrafluoroethylene modified by ion implantation

  • Author

    Rong Xu ; Jue Wang ; Chengyan Ren ; Ying Zhao ; Ping Yan

  • Author_Institution
    Key Lab. of Power Electron. & Electr. Drives, Inst. of Electr. Eng., Beijing, China
  • fYear
    2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Surface characteristics of Insulator effect its surface flashover performance obviously, appropriate surface treatment can increase the surface flashover voltage. Ion implantation technology is an effective surface modification tool, it can change the roughness, resistivity and adsorbability on the insulator surface. Polytetrafluoroethylene (PTFE) was modified by C ion and nitrogen ion by using a electron cyclotron resonance (ECR) ion source. The surface flashover voltage were measured on the experimental platforms of surface characteristics in vacuum before and after modification, Also the characteristies and microstructure of the implanted layer were studied by using the SEM and XPS and find the influencing factors on surface flashover properties of PTFE modified by ion implantation.
  • Keywords
    X-ray photoelectron spectra; carbon; cyclotron resonance; electrical resistivity; flashover; ion implantation; nitrogen; polymer insulators; polymers; scanning electron microscopy; surface roughness; surface treatment; C; N; SEM; X-ray photoelectron spectra; XPS; adsorbability; electron cyclotron resonance; insulator surface; ion implantation; polytetrafluoroethylene; resistivity; scanning electron microscopy; surface flashover properties; surface flashover voltage; surface roughness; surface treatment; Flashover; Insulators; Ion implantation; Rough surfaces; Surface roughness; Surface treatment; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
  • Conference_Location
    San Francisco, CA
  • ISSN
    0730-9244
  • Type

    conf

  • DOI
    10.1109/PLASMA.2013.6635144
  • Filename
    6635144