DocumentCode
1602977
Title
20V-high speed low cost arbitrary waveform generator for ICs immunity test
Author
Xu Gao ; Tianqi Li ; Mentesana, N.B. ; Zhenwei Yu ; Gafarov, A.Y. ; Liehui Ren ; Hongyu An ; Pommerenke, D.
Author_Institution
EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
fYear
2011
Firstpage
846
Lastpage
849
Abstract
A >;30V high speed, low resolution and low cost arbitrary waveform generator has been prototyped. It uses FPGA transceivers and resistive weighting networks and broadband power amplification. The sampling rate of this arbitrary waveform generator is 6.25 Gsps, allowing rise times down to 130 ps. As 4 transceiver channels are used a 4 bit resolution is achieved. The generator is combined with a wide band (20MHz - 6 GHz) power amplifier allowing >; 20V at 50-Ohm load. The intended application is IC immunity testing. Here different waveforms and exact timing is needed. Using different FPGAs the concept can be extended to higher resolution and faster sampling rates. The project was completed in a 400 level RF design class during only one semester.
Keywords
field programmable gate arrays; immunity testing; integrated circuit testing; power amplifiers; transceivers; waveform generators; FPGA transceivers; RF design class; arbitrary waveform generator; broadband power amplification; integrated circuit immunity test; power amplifier; resistive weighting networks; rise time; sampling rate; transceiver channels; voltage 20 V; Field programmable gate arrays; Immunity testing; Power amplifiers; Pulse measurements; Resistors; Signal generators; Transceivers;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
Conference_Location
Long Beach, CA, USA
ISSN
2158-110X
Print_ISBN
978-1-4577-0812-1
Type
conf
DOI
10.1109/ISEMC.2011.6038426
Filename
6038426
Link To Document