• DocumentCode
    1602977
  • Title

    20V-high speed low cost arbitrary waveform generator for ICs immunity test

  • Author

    Xu Gao ; Tianqi Li ; Mentesana, N.B. ; Zhenwei Yu ; Gafarov, A.Y. ; Liehui Ren ; Hongyu An ; Pommerenke, D.

  • Author_Institution
    EMC Lab., Missouri Univ. of Sci. & Technol., Rolla, MO, USA
  • fYear
    2011
  • Firstpage
    846
  • Lastpage
    849
  • Abstract
    A >;30V high speed, low resolution and low cost arbitrary waveform generator has been prototyped. It uses FPGA transceivers and resistive weighting networks and broadband power amplification. The sampling rate of this arbitrary waveform generator is 6.25 Gsps, allowing rise times down to 130 ps. As 4 transceiver channels are used a 4 bit resolution is achieved. The generator is combined with a wide band (20MHz - 6 GHz) power amplifier allowing >; 20V at 50-Ohm load. The intended application is IC immunity testing. Here different waveforms and exact timing is needed. Using different FPGAs the concept can be extended to higher resolution and faster sampling rates. The project was completed in a 400 level RF design class during only one semester.
  • Keywords
    field programmable gate arrays; immunity testing; integrated circuit testing; power amplifiers; transceivers; waveform generators; FPGA transceivers; RF design class; arbitrary waveform generator; broadband power amplification; integrated circuit immunity test; power amplifier; resistive weighting networks; rise time; sampling rate; transceiver channels; voltage 20 V; Field programmable gate arrays; Immunity testing; Power amplifiers; Pulse measurements; Resistors; Signal generators; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
  • Conference_Location
    Long Beach, CA, USA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4577-0812-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2011.6038426
  • Filename
    6038426