• DocumentCode
    1604248
  • Title

    New processing techniques: sweeping of quartz wafers and a practical method for processing quartz resonators under controlled conditions

  • Author

    Bowen, Curt ; Houck, Gilbert

  • Author_Institution
    Precision Quartz Products, Camp Hill, PA, USA
  • fYear
    1992
  • Firstpage
    648
  • Lastpage
    656
  • Abstract
    Electrodiffusion of `sweeping´ has been used to remove impurities from quartz material. Traditionally, quartz is swept in the bar form prior to being cut into wafers. It is argued that it would be advantageous to place the sweeping operation later into the process, i.e., experience as much of the blank processing yield loss as possible with unswept quartz, and only sweep those that have successfully completed the blank processes. A system has been developed to greatly improve the conditions under which resonators are processed, without totally retooling the manufacturing line. The system utilizes a transportable chamber within which partially completed resonator assemblies are kept. The chamber allows access to the crystals in a clean, dry, gas environment. The temperature of the chamber can be raised to more than 300°C to facilitate the elevated temperature steps in the process, i.e., conductive cement curing, preplating bake, etc
  • Keywords
    crystal resonators; quartz; blank processing yield loss; conductive cement curing; controlled conditions; electrodiffusion; elevated temperature steps; partially completed resonator assemblies; preplating bake; processing techniques; quartz wafers; transportable chamber; Costs; Current density; Etching; Impurities; Lapping; Manufacturing processes; Radiation effects; Temperature; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
  • Conference_Location
    Hershey, PA
  • Print_ISBN
    0-7803-0476-4
  • Type

    conf

  • DOI
    10.1109/FREQ.1992.270049
  • Filename
    270049