DocumentCode
1605109
Title
PZT thin films for RF MEMS applications
Author
Polcawich, Ronald G. ; Pulskamp, Jeff ; Judy, Dan ; Kaul, Roger ; Chandrahalim, Hengky ; Bhave, Sunil ; Dubey, Madan
Author_Institution
US Army Research Laboratory, AMSRD-ARL-SE-RL, 2800 Powder Mill Road, Adelphi, MD, 20783, USA
Volume
2
fYear
2008
Firstpage
1
Lastpage
2
Abstract
In this article, we report on the successful demonstration of lead zirconate titanate (PZT) thin film based MEMS devices for use in radio frequency (RF) systems. Both series and shunt switches operating at or below 10 V and 15 V, respectively, have been developed capable of operating over a wide temperature range. These switches have also been integrated into a 17 GHz, 2-bit reflection phase shifter with an average insertion loss of 2.96 dB. Along with switches and phase shifters, PZT based MEMS resonators show promise in the sub-GHz regime with demonstrated insertion loss values near ??12 dB and theoretical predictions approaching better than ??3 dB.
Keywords
Insertion loss; Microelectromechanical devices; Phase shifters; Radio frequency; Radiofrequency microelectromechanical systems; Switches; Temperature distribution; Thin film devices; Titanium compounds; Transistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location
Santa Re, NM, USA
ISSN
1099-4734
Print_ISBN
978-1-4244-2744-4
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2008.4693748
Filename
4693748
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