BENeFITS - A step to ATE of the future

Author

Ross, William A. ; Hernandez, J. Luis

Author_Institution

US Naval Air Systems Command, Washington, DC, USA

fYear

1992

Firstpage

15

Lastpage

20

Abstract

The authors discuss the results of a proof-of-concept effort aimed at defining an automatic test equipment (ATE) architecture that incorporates both built-in-test (BIT) data and functional testing techniques. The concept, called BENeFITS (BIT-Enhanced Functional Test System), uses fault guided analysis techniques to process BIT failure data retrieved from the unit under test and perform functional testing only on the sections indicated by BIT. Other features include the use of software algorithms and artificial intelligence (AI) principles to improve fault callout accuracies over time.<>

Keywords

artificial intelligence; automatic test equipment; built-in self test; diagnostic expert systems; military computing; military systems; AI; ATE; BENeFITS; BIT failure data; BIT-Enhanced Functional Test System; DOD; NAVAIR; Navy; artificial intelligence; automatic test equipment; built-in-test; fault callout accuracies; fault guided analysis; functional testing; prototype; software algorithms; Algorithm design and analysis; Automatic test equipment; Computer architecture; Costs; Failure analysis; Fault detection; Information retrieval; Instruments; Prototypes; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record

Conference_Location

Dayton, OH, USA

Print_ISBN

0-7803-0643-0

Type

conf

DOI

10.1109/AUTEST.1992.270140

Filename

270140