• DocumentCode
    1606786
  • Title

    A 15ns 4Mb NVSRAM in 0.13u SONOS Technology

  • Author

    Fliesler, Michael ; Still, David ; Hwang, Jeong-Mo

  • Author_Institution
    Cypress Semicond., San Jose, CA
  • fYear
    2008
  • Firstpage
    83
  • Lastpage
    86
  • Abstract
    SONOS based 4Mb nvSRAM has been developed which combines a fast access CMOS SRAM array with a highly reliable non-volatile memory array. The overall architecture and operation of the integrated architecture is discussed The non-volatile memory characteristics including endurance and retention at both the SONOS transistor-level as well as 4Mb product-level are demonstrated The nonvolatile memory uses Fowler-Nordheim program and erase to achieve excellent reliability, with EOL window > 1V after 10 years of retention at 85degC and 200K endurance cycles.
  • Keywords
    CMOS memory circuits; random-access storage; CMOS SRAM array; Fowler-Nordheim program; NVSRAM; SONOS transistor-level; memory size 4 MByte; nonvolatile memory array; size 0.13 micron; Batteries; CMOS technology; Computer architecture; Driver circuits; Microcontrollers; Nonvolatile memory; Power supplies; Random access memory; SONOS devices; Springs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Semiconductor Memory Workshop, 2008 and 2008 International Conference on Memory Technology and Design. NVSMW/ICMTD 2008. Joint
  • Conference_Location
    Opio
  • Print_ISBN
    978-1-4244-1546-5
  • Electronic_ISBN
    978-1-4244-1547-2
  • Type

    conf

  • DOI
    10.1109/NVSMW.2008.30
  • Filename
    4531830