• DocumentCode
    1606794
  • Title

    Transient response testing of mixed-signal ASICs

  • Author

    Taylor, D. ; Evans, P.S.A. ; Pritchard, T.I.

  • Author_Institution
    Sch. of Eng., Huddersfield Polytech., UK
  • fYear
    1992
  • Firstpage
    359
  • Lastpage
    362
  • Abstract
    Problems associated with testing mixed-signal (mixed analog and digital) ASICs are reviewed, and transient response analysis is justified as a test technique for the analog cells embedded in these devices. Fault simulations for assessing the fault coverage of the technique in a mixed-signal cell library are compared with the results obtained in testing device samples exhibiting a range of cell defects
  • Keywords
    integrated circuit testing; mixed analogue-digital integrated circuits; transient response; embedded analog cells; fault coverage; fault simulation; mixed-signal ASICs; mixed-signal cell library; testing; transient response analysis; Application specific integrated circuits; Circuit faults; Circuit simulation; Circuit testing; Digital signal processing; Impulse testing; Logic testing; System testing; Transient analysis; Transient response;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1992., Proceedings of Fifth Annual IEEE International
  • Conference_Location
    Rochester, NY
  • Print_ISBN
    0-7803-0768-2
  • Type

    conf

  • DOI
    10.1109/ASIC.1992.270219
  • Filename
    270219
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1606794