DocumentCode
1607340
Title
Calibration parameters principles for MATLAB S-functions using CANApe
Author
Muresan, Marius ; Pitica, Dan ; Chindris, Gabriel
Author_Institution
Appl. Electron. Dept., Tech. Univ. of Cluj-Napoca, Cluj-Napoca, Romania
fYear
2008
Firstpage
105
Lastpage
110
Abstract
In the development of embedded software one of the harder tasks are testing and optimize the ECUs. The basic way to test and optimize is by measuring and calibrating the process. One of the common methods to solve this problem is dasiaHardware-in-the-Looppsila(HIL). With this method, the real ECU is place in a simulative environment for the software under test. The software runs on the real target hardware. The basic idea with dasiaSoftware-in-the-Looppsila(SIL) is the same, except that all runs on standard PC hardware. [1] Both for HIL and SIL many simulated models for automotive industry are made in MATLAB/Simulink. A way how to put ECU´s software into MATLAB/Simulink in order to have a complete testing environment will reduce considerably the testing costs and time to market. To have a unitary view both for HIL and SIL we must use the same approach. To keep the consistency we should use the same measurement and application tool, in our case CANApe. This will be done using XCP protocol based on Ethernet TCP/IP transport layer. [2] The entire ECU´s software will be wrapped into a MATLAB/Simulink S-Function. The obtained S-Function will be a part of the entire model, with the possibility of having access to the inside variables of the S-Function.
Keywords
automobiles; control engineering computing; program testing; traffic engineering computing; CANApe; ECU optimization; ECU testing; Ethernet TCP-IP transport layer; Hardware-in-the-Loop testing; MATLAB S-functions; MATLAB Simulink; Software-in-the-Loop testing; XCP protocol; automotive industry; calibration parameters; embedded software development; software testing; Application software; Automotive engineering; Calibration; Costs; Embedded software; Hardware; MATLAB; Mathematical model; Software testing; Time to market;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics Technology, 2008. ISSE '08. 31st International Spring Seminar on
Conference_Location
Budapest
Print_ISBN
978-1-4244-3972-0
Electronic_ISBN
978-1-4244-3974-4
Type
conf
DOI
10.1109/ISSE.2008.5276436
Filename
5276436
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