• DocumentCode
    1609410
  • Title

    Evaluation of a new low cost software level fault tolerance technique to cope with soft errors

  • Author

    Tarrillo, J.F. ; Lisboa, C.A. ; Carro, L. ; Argyrides, C. ; Pradhan, D.K.

  • Author_Institution
    Inst. de Inf., Univ. Fed. do Rio Grande do Sul, Porto Alegre, Brazil
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    Increasing soft error rates make the protection of combinational logic against transient faults in future technologies a major issue for the fault tolerance community. Since not every transient fault leads to an error at application level, software level fault tolerance has been proposed by several authors as a better approach. In this paper, a new software level technique to detect and correct errors due to transient faults is proposed and compared to a classic one, and the costs of detection and correction for both approaches are compared and discussed.
  • Keywords
    combinational circuits; error correction; fault tolerance; radiation hardening (electronics); combinational logic; error correction; soft error rates; software level fault tolerance; transient fault; DH-HEMTs; Encoding; Finite element methods; Polynomials; Software; Sorting; Transient analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Workshop (LATW), 2010 11th Latin American
  • Conference_Location
    Pule del Este
  • Print_ISBN
    978-1-4244-7786-9
  • Electronic_ISBN
    978-1-4244-7785-2
  • Type

    conf

  • DOI
    10.1109/LATW.2010.5550371
  • Filename
    5550371