• DocumentCode
    1610978
  • Title

    Bandwidth extension of metamaterials with low reflectivity

  • Author

    Huang, Ruifeng ; Li, Zheng-Wen ; Liu, Lie ; Kong, Ling Bing

  • Author_Institution
    Temasek Labs., Nat. Univ. of Singapore, Singapore, Singapore
  • fYear
    2011
  • Firstpage
    931
  • Lastpage
    934
  • Abstract
    Following introduction of a figure of merit to quantify the thickness-normalized bandwidth of metamaterials for reflectivity reduction from metallic surfaces, possible methods are explored to design broadband metamaterials with low reflectivity. It is presented that the static permeability of substrate, the frequency-dispersion of permeability and permittivity of substrate, and the metallic resonant patterns all determine the figure of merit, and in turn the bandwidth of broadband metamaterials. Both numerical and experimental examples are included to validate the designs.
  • Keywords
    metamaterials; permeability; reflectivity; bandwidth extension; broadband metamaterial design; figure of merit; metallic surfaces; reflectivity reduction; substrate static permeability; thickness-normalized bandwidth; Bandwidth; Magnetic materials; Metamaterials; Permeability; Reflectivity; Resonant frequency; Substrates; Metamaterial; bandwidth; figure of merit; reflectivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference Proceedings (APMC), 2011 Asia-Pacific
  • Conference_Location
    Melbourne, VIC
  • Print_ISBN
    978-1-4577-2034-5
  • Type

    conf

  • Filename
    6173905