• DocumentCode
    1612694
  • Title

    Modified wetting balance set-up for the evaluation of lead-free solder / flux / metallization systems

  • Author

    Balluch, B. ; Smetana, W. ; Fleischer, W.

  • Author_Institution
    Inst. of Sensor & Actuator Syst., Vienna Univ. of Technol.
  • fYear
    0
  • Firstpage
    150
  • Lastpage
    155
  • Abstract
    This paper presents experimental investigations of wettability on lead-free solder/flux/solid metallization combinations obtained under nitrogen atmosphere. An adapted testing method is applied where fluxed samples are preheated. A commonly performed wetting balance testing method is explained in principle and the measurement system modifications as well as the adapted experimental procedures being performed are discussed in detail. Lead-free tin-silver alloy Sn96 Ag and a copper doped Sn96Ag3.5Cu solder have been considered for testing in combination with five different widely employed FR4-metallization finishes and three Ag-based thick film conductor pastes. Selected solder bath temperatures cover the range from 240degC up to 260degC. One conventional RMA-type flux and two low solid no-clean fluxes have been provided for promoting the wetting tests. The effect of sample preheating varying within the range from 85degC to 115degC is investigated. Results are compared to conventional lead bearing material systems
  • Keywords
    conducting materials; copper alloys; heat treatment; materials testing; metallisation; silver alloys; solders; thick films; tin alloys; wetting; 240 to 260 C; 85 to 115 C; FR4-metallization finish; RMA-type flux; Sn96Ag3.5Cu:Cu; adapted testing method; copper doped solder; lead-free solder-flux-metallization systems; lead-free tin-silver alloys; low solid no-clean fluxes; modified wetting balance set-up; solder bath temperature; thick film conductor pastes; wetting balance testing method; Atmosphere; Copper; Environmentally friendly manufacturing techniques; Lead; Metallization; Nitrogen; Performance evaluation; Solids; Testing; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2005. 28th International Spring Seminar on
  • Conference_Location
    Wiener Neustadt
  • Print_ISBN
    0-7803-9325-2
  • Type

    conf

  • DOI
    10.1109/ISSE.2005.1491017
  • Filename
    1491017