DocumentCode
1614232
Title
Analysis of puncturing pattern for high rate turbo codes
Author
Mo, Fan ; Kwatra, S.C. ; Kim, Junghwan
Author_Institution
Dept. of Electr. Eng. & Comput. Sci., Toledo Univ., OH, USA
Volume
1
fYear
1999
fDate
6/21/1905 12:00:00 AM
Firstpage
547
Abstract
Turbo codes have performance superior than all other coding techniques. The main factors that make turbo codes so efficient include, parallel concatenation structure of the encoding system, recursive convolutional encoder, interleaver, puncturing pattern and iterative decoding. In this research, we have investigated the effect of the puncturing pattern on the performance of high rate turbo codes. Based on simulation results, we claim that for most of the code rates, when a pseudo random interleaver is applied, the selection of puncturing pattern does not have significant effect on the code performance. However, for some rates, a commonly used puncturing patterns does cause much poorer performance. For these rates, a modified puncturing pattern is proposed which restores the performance back to the Shannon limit
Keywords
concatenated codes; convolutional codes; interleaved codes; iterative decoding; turbo codes; Shannon limit; high rate turbo codes; iterative decoding; parallel concatenation structure; pseudo random interleaver; puncturing pattern; recursive convolutional encoder; Bit error rate; Computer science; Convolutional codes; Error correction; Iterative decoding; NASA; Pattern analysis; Turbo codes;
fLanguage
English
Publisher
ieee
Conference_Titel
Military Communications Conference Proceedings, 1999. MILCOM 1999. IEEE
Conference_Location
Atlantic City, NJ
Print_ISBN
0-7803-5538-5
Type
conf
DOI
10.1109/MILCOM.1999.822742
Filename
822742
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