• DocumentCode
    1614232
  • Title

    Analysis of puncturing pattern for high rate turbo codes

  • Author

    Mo, Fan ; Kwatra, S.C. ; Kim, Junghwan

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Toledo Univ., OH, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    6/21/1905 12:00:00 AM
  • Firstpage
    547
  • Abstract
    Turbo codes have performance superior than all other coding techniques. The main factors that make turbo codes so efficient include, parallel concatenation structure of the encoding system, recursive convolutional encoder, interleaver, puncturing pattern and iterative decoding. In this research, we have investigated the effect of the puncturing pattern on the performance of high rate turbo codes. Based on simulation results, we claim that for most of the code rates, when a pseudo random interleaver is applied, the selection of puncturing pattern does not have significant effect on the code performance. However, for some rates, a commonly used puncturing patterns does cause much poorer performance. For these rates, a modified puncturing pattern is proposed which restores the performance back to the Shannon limit
  • Keywords
    concatenated codes; convolutional codes; interleaved codes; iterative decoding; turbo codes; Shannon limit; high rate turbo codes; iterative decoding; parallel concatenation structure; pseudo random interleaver; puncturing pattern; recursive convolutional encoder; Bit error rate; Computer science; Convolutional codes; Error correction; Iterative decoding; NASA; Pattern analysis; Turbo codes;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Military Communications Conference Proceedings, 1999. MILCOM 1999. IEEE
  • Conference_Location
    Atlantic City, NJ
  • Print_ISBN
    0-7803-5538-5
  • Type

    conf

  • DOI
    10.1109/MILCOM.1999.822742
  • Filename
    822742