• DocumentCode
    1614483
  • Title

    Characterization of Runtime and Jitter on a Laser Triggered Spark Gap Switch

  • Author

    Hutsel, Brian ; Sullivan, Dustin ; Benwell, Andrew ; Vangordon, James ; Kovaleski, Scott ; Gahl, John

  • Author_Institution
    Missouri-Columbia Univ., Columbia
  • fYear
    2007
  • Firstpage
    191
  • Lastpage
    191
  • Abstract
    Summary form only given. A 1 MV, SF6 filled, laser triggered gas switch has been installed on the University of Missouri pulsed power test stand to study the factors affecting runtime and jitter. The test stand consists of a 2.8 MV, 450 kJ Marx bank that feeds into a 7 nF intermediate store capacitor before discharging through the gas switch. The test was operated from about 1 MV up to 2.5 MV, at switch pressures from 1 to 4 atm. The gas switch is triggered by a 30 mJ New Wave Tempest 10 Nd:YAG laser to initiate breakdown in the switch. The University of Missouri has examined factors including the applied field, rate of rise and gas pressure of the switch along with the laser power, focused intensity, and Rayleigh range and determined their relation to jitter and runtime. Optical spectroscopy has been used to examine both the laser arc and the resulting switch discharge plasma parameters and composition. The end goal of research is to understand the factors contributing to increased jitter and runtime and thereby provide paths to improved switch performance.
  • Keywords
    arcs (electric); plasma diagnostics; plasma switches; pulsed power switches; spark gaps; Marx bank; Rayleigh range; capacitance 7 nF; energy 30 mJ; energy 450 kJ; intermediate store capacitor; laser arc; laser triggered spark gap switch; optical spectroscopy; pressure 1 atm to 4 atm; pulsed power test stand; switch discharge plasma; voltage 1 MV; voltage 2.8 MV; Capacitors; Feeds; Gas lasers; Jitter; Optical pulses; Optical switches; Power lasers; Runtime; Sparks; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Plasma Science, 2007. ICOPS 2007. IEEE 34th International Conference on
  • Conference_Location
    Albuquerque, NM
  • ISSN
    0730-9244
  • Print_ISBN
    978-1-4244-0915-0
  • Type

    conf

  • DOI
    10.1109/PPPS.2007.4345497
  • Filename
    4345497